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1

Reliability Study of Ferroelectric Al:HfO 2 Thin Films for DRAM and NAND Applications

Florent, Karine, Lavizzari, Simone, Di Piazza, Luca, Popovici, Mihaela, Duan, Jingyu, Groeseneken, Guido, Van Houdt, Jan

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 2.72 MB

english, 2017

2

Characterization of charge trapping in SiO2/Al2O3 dielectric stacks by pulsed C–V technique

Giuseppina Puzzilli, Bogdan Govoreanu, Fernanda Irrera, Maarten Rosmeulen, Jan Van Houdt

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 465 KB

english, 2007

3

Distribution and generation of traps in SiO2/Al2O3 gate stacks

Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 129 KB

english, 2007

4

Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness

Pavel Poliakov, Pieter Blomme, Miguel Miranda Corbalan, Jan Van Houdt, Wim Dehaene

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 1.34 MB

english, 2011

5

Physical understanding and modeling of SANOS retention in programmed state

Arnaud Furnémont, Antonio Cacciato, Laurent Breuil, Maarten Rosmeulen, Herman Maes, Kristin De Meyer, Jan Van Houdt

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 1006 KB

english, 2008

6

Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories

Pavel Poliakov, Pieter Blomme, Alessandro Vaglio Pret, Miguel Miranda Corbalan, Roel Gronheid, Diederik Verkest, Jan Van Houdt, Wim Dehaene

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 732 KB

english, 2012

7

Characterization of recombinant human C1 inhibitor secreted in milk of transgenic rabbits

Harrie A. van Veen, Jaco Koiter, Carla J.M. Vogelezang, Noucha van Wessel, Tijtje van Dam, Ingeborg Velterop, Kristina van Houdt, Luc Kupers, Danielle Horbach, Mourad Salaheddine, Jan H. Nuijens, Maur

Journal:

Journal of Biotechnology

Year:

2012

Language:

english

File:

PDF, 750 KB

english, 2012

8

Impact of Charge Trapping Layer Thickness and New Trade-Off in Performance Characteristics of 3-D SONOS Devices

Arreghini, Antonio, Kar, Gouri Sankar, Van den bosch, Geert, Van Houdt, Jan

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 263 KB

english, 2013

9

Reliability Comparison of ISSG Oxide and HTO as Tunnel Dielectric in 3-D–SONOS Applications

Qiao, Fengying, Arreghini, Antonio, Blomme, Pieter, Date, Lucien, Van den Bosch, Geert, Pan, Liyang, Xu, Jun, Van Houdt, Jan

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 329 KB

english, 2013

10

TID Radiation Response of 3-D Vertical GAA SONOS Memory Cells

Qiao, Fengying, Pan, Liyang, Blomme, Pieter, Arreghini, Antonio, Liu, Lifang, Van den bosch, Geert, Van Houdt, Jan, Xu, Jun

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 687 KB

english, 2014

11

Assessment methodology of the lateral migration component in data retention of 3D SONOS memories

Liu, Lifang, Arreghini, Antonio, Van den bosch, Geert, Pan, Liyang, Van Houdt, Jan

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.53 MB

english, 2014

12

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Role of holes and electrons during erase of TANOS memories: Evidences for dipole formation and its impact on reliability

Vandelli, Luca, Padovani, Andrea, Larcher, Luca, Arreghini, Antonio, Van den bosch, Geert, Jurczak, Malgorzata, Van Houdt, Jan, Marca, Vincenzo Della, Pavan, Paolo

Year:

2010

Language:

english

File:

PDF, 1.18 MB

english, 2010

13

[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - Scaling of Floating Gate electrode for sub-40nm flash technologies

De Vos, Joeri, Wellekens, Dirk, Debusschere, Ingrid, Van Houdt, Jan, Van Aerde, Steven R.A., Fischer, Pamela R., Zagwijn, Peter M.

Year:

2008

Language:

english

File:

PDF, 728 KB

english, 2008

14

On the Roll-Off of the Activation Energy Plot in High-Temperature Flash Memory Retention Tests and its Impact on the Reliability Assessment

Govoreanu, Bogdan, Van Houdt, Jan

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 152 KB

english, 2008

15

Correction for pulse height variability reduces physiological noise in functional MRI when studying spontaneous brain activity

Petra J. van Houdt, Pauly P.W. Ossenblok, Paul A.J.M. Boon, Frans S.S. Leijten, Demetrios N. Velis, Cornelis J. Stam, Jan C. de Munck

Journal:

Human Brain Mapping

Year:

2010

Language:

english

File:

PDF, 1.86 MB

english, 2010

16

Profiling of traps in SiO2/Al2O3 gate stack by the charge pumping technique

Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt

Journal:

Materials Science in Semiconductor Processing

Year:

2006

Language:

english

File:

PDF, 132 KB

english, 2006

17

Comparison of analytical strategies for EEG-correlated fMRI data in patients with epilepsy

Petra J. van Houdt, Jan C. de Munck, Maeike Zijlmans, Geertjan Huiskamp, Frans S.S. Leijten, Paul A.J.M. Boon, Pauly P.W. Ossenblok

Journal:

Magnetic Resonance Imaging

Year:

2010

Language:

english

File:

PDF, 748 KB

english, 2010

18

An effective model for analysing tunneling gate leakage currents through ultrathin oxides and high-k gate stacks from Si inversion layers

Bogdan Govoreanu, Pieter Blomme, Kirklen Henson, Jan Van Houdt, Kristin De Meyer

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 780 KB

english, 2004

19

Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique

Maarten Rosmeulen, Laurent Breuil, Martino Lorenzini, Luc Haspeslagh, Jan Van Houdt, Kristin De Meyer

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 385 KB

english, 2004

20

Characterization of moving bits (MBs) and QBD in wet/dry tunnel oxides for floating gate type nonvolatile memory (FG-NVM) applications

Jan Ackaert, Antony Lowe, Sylvie Boonen, Thierry Yao, Joseph Rayhem, Bart Desoete, Jagdish Prasad, Mike Thomason, Jan Van Houdt, Robin Degraeve, Luc Haspeslagh, Paul Hendrickx

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 434 KB

english, 2004

21

Foreword

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 60 KB

english, 2008

22

Modelling of the hole-initiated impact ionization current in the framework of hydrodynamic equations

Martino Lorenzini, Jan Van Houdt

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 324 KB

english, 2002

23

A model for tunneling current in multi-layer tunnel dielectrics

Bogdan Govoreanu, Pieter Blomme, Maarten Rosmeulen, Jan Van Houdt, Kristin De Meyer

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 309 KB

english, 2003

24

A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique

Moonju Cho, Robin Degraeve, Philippe Roussel, Bogdan Govoreanu, Ben Kaczer, Mohammed B. Zahid, Eddy Simoen, Antonio Arreghini, Malgorzata Jurczak, Jan Van Houdt, Guido Groeseneken

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 1.09 MB

english, 2010

25

Write/erase degradation and disturb effects in source-side injection flash eeprom devices

Dirk Wellekens, Jan van Houdt, Guido Groeseneken, Herman E. Maes, Lorenzo Faraone

Journal:

Quality and Reliability Engineering International

Year:

1995

Language:

english

File:

PDF, 719 KB

english, 1995

26

Charge-based nonvolatile memory: Near the end of the roadmap?

Journal:

Current Applied Physics

Year:

2011

Language:

english

File:

PDF, 413 KB

english, 2011

27

CYP2C8 polymorphisms in Caucasians and their relationship with paclitaxel 6α-hydroxylase activity in human liver microsomes

Namrata Bahadur, Julian B.S Leathart, Elaine Mutch, Dorothy Steimel-Crespi, Stuart A Dunn, Ron Gilissen, Jos Van Houdt, Jan Hendrickx, Geert Mannens, Hilde Bohets, Faith M Williams, Martin Armstrong,

Journal:

Biochemical Pharmacology

Year:

2002

Language:

english

File:

PDF, 291 KB

english, 2002

28

Linking EUV lithography line edge roughness and 16 nm NAND memory performance

Alessandro Vaglio Pret, Pavel Poliakov, Roel Gronheid, Pieter Blomme, Miguel Miranda Corbalan, Wim Dehaene, Diederik Verkest, Jan Van Houdt, Davide Bianchi

Journal:

Microelectronic Engineering

Year:

2012

Language:

english

File:

PDF, 880 KB

english, 2012

29

Unique stress response to the lactoperoxidase-thiocyanate enzyme system in Escherichia coli

Jan Sermon, Kristof Vanoirbeek, Philipp De Spiegeleer, Rob Van Houdt, Abram Aertsen, Chris W. Michiels

Journal:

Research in Microbiology

Year:

2005

Language:

english

File:

PDF, 129 KB

english, 2005

30

A semi-automatic method to determine electrode positions and labels from gel artifacts in EEG/fMRI-studies

Jan C. de Munck, Petra J. van Houdt, Ruud M. Verdaasdonk, Pauly P.W. Ossenblok

Journal:

Year:

2012

Language:

english

File:

PDF, 922 KB

english, 2012

31

Novel artefact removal algorithms for co-registered EEG/fMRI based on selective averaging and subtraction

Jan C. de Munck, Petra J. van Houdt, Sónia I. Gonçalves, Erwin van Wegen, Pauly P.W. Ossenblok

Journal:

Year:

2013

Language:

english

File:

PDF, 2.31 MB

english, 2013

32

Heritability of cortisol response to confinement stress in European sea bassdicentrarchus labrax

Filip AM Volckaert, Bart Hellemans, Costas Batargias, Bruno Louro, Cécile Massault, Jeroen KJ Van Houdt, Chris Haley, Dirk-Jan de Koning, Adelino VM Canario

Journal:

Genetics Selection Evolution

Year:

2012

Language:

english

File:

PDF, 241 KB

english, 2012

33

EEG-fMRI correlation patterns in the presurgical evaluation of focal epilepsy: A comparison with electrocorticographic data and surgical outcome measures

van Houdt, Petra J., de Munck, Jan C., Leijten, Frans S.S., Huiskamp, Geertjan J.M., Colon, Albert J., Boon, Paul A.J.M., Ossenblok, Pauly P.W.

Journal:

Year:

2013

Language:

english

File:

PDF, 1.51 MB

english, 2013

34

Care pathways across the primary-hospital care continuum: using the multi-level framework in explaining care coordination

Van Houdt, Sabine, Heyrman, Jan, Vanhaecht, Kris, Sermeus, Walter, De Lepeleire, Jan

Journal:

BMC Health Services Research

Year:

2013

Language:

english

File:

PDF, 255 KB

english, 2013

35

Exome sequencing identifies ZFPM2 as a cause of familial isolated congenital diaphragmatic hernia and possibly cardiovascular malformations

Brady, Paul D., Van Houdt, Jeroen, Callewaert, Bert, Deprest, Jan, Devriendt, Koenraad, Vermeesch, Joris R.

Journal:

European Journal of Medical Genetics

Year:

2014

Language:

english

File:

PDF, 476 KB

english, 2014

36

Evaluation and Solutions for P/E Window Instability Induced by Electron Trapping in High- $\kappa$ Intergate Dielectrics of Flash Memory Cells

Baojun Tang,, Wei Dong Zhang,, Degraeve, Robin, Breuil, Laurent, Blomme, Pieter, Jian Fu Zhang,, Zhigang Ji,, Zahid, Mohammed, Toledano-Luque, Maria, Van den Bosch, Geert, Van Houdt, Jan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.78 MB

english, 2014

37

Experimental Evidence Toward Understanding Charge Pumping Signals in 3-D Devices With Poly-Si Channel

Baojun Tang,, Weidong Zhang,, Toledano-Luque, Maria, Jian Fu Zhang,, Degraeve, Robin, Zhigang Ji,, Arreghini, Antonio, Van den Bosch, Geert, Van Houdt, Jan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.85 MB

english, 2014

38

High-k gadolinium and aluminum scandates for hybrid floating gate NAND flash

Lisoni, Judit G., Breuil, Laurent, Nyns, Laura, Blomme, Pieter, Van den bosch, Geert, Van Houdt, Jan

Journal:

Microelectronic Engineering

Year:

2013

Language:

english

File:

PDF, 667 KB

english, 2013

39

RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application

de Andrade, Maria Glória Caño, Toledano-Luque, María, Fourati, Fatma, Degraeve, Robin, Martino, João Antonio, Claeys, Cor, Simoen, Eddy, Van den Bosch, Geert, Van Houdt, Jan

Journal:

Microelectronic Engineering

Year:

2013

Language:

english

File:

PDF, 807 KB

english, 2013

40

Read and Pass Disturbance in the Programmed States of Floating Gate Flash Memory Cells With High-$\kappa$ Interpoly Gate Dielectric Stacks

Tang, Baojun, Robinson, Colin, Zhang, Wei Dong, Zhang, Jian Fu, Degraeve, Robin, Blomme, Pieter, Toledano-Luque, Maria, Van den bosch, Geert, Govoreanu, Bogdan, Van Houdt, Jan

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.15 MB

english, 2013

41

[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - The future of flash memory: Is floating gate technology doomed to lose the race?

Wellekens, Dirk, Van Houdt, Jan

Year:

2008

Language:

english

File:

PDF, 384 KB

english, 2008

42

Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories

Suhane, Amit, Arreghini, Antonio, Van den bosch, Geert, Vandelli, Luca, Padovani, Andrea, Breuil, Laurent, Larcher, Luca, De Meyer, Kristin, Van Houdt, Jan

Journal:

IEEE Electron Device Letters

Year:

2010

Language:

english

File:

PDF, 434 KB

english, 2010

43

[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - Exploration of rare earth materials for future interpoly dielectric replacement in Flash memory devices

Wellekens, Dirk, Van Elshocht, Sven, Adelmann, Christoph, Meersschaut, Johan, Swerts, Johan, Kittl, Jorge, Cacciato, Antonio, Debusschere, Ingrid, Jurczak, Malgorzata, Van Houdt, Jan

Year:

2010

Language:

english

File:

PDF, 520 KB

english, 2010

44

[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - Novel dual layer floating gate structure as enabler of fully planar flash memory

Blomme, Pieter, Rosmeulen, Maarten, Cacciato, Antonio, Kostermans, Maarten, Vrancken, Christa, Van Aerde, Steven, Schram, Tom, Debusschere, Ingrid, Jurczak, Malgorzata, Van Houdt, Jan

Year:

2010

Language:

english

File:

PDF, 452 KB

english, 2010

45

[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Optimization of Al2O3 Interpoly Dielectric for Embedded Flash Memory Applications

Wellekens, Dirk, De Vos, Joeri, Van Houdt, Jan, van der Zanden, Koen

Year:

2008

Language:

english

File:

PDF, 467 KB

english, 2008

46

Enhanced Tunneling Current Effect for Nonvolatile Memory Applications

Govoreanu, Bogdan, Blomme, Pieter, Van Houdt, Jan, De Meyer, Kristin

Journal:

Japanese Journal of Applied Physics

Year:

2003

Language:

english

File:

PDF, 219 KB

english, 2003

47

[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan, Italy (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Ultimate Scaling Projection of Cylindrical 3D SONOS Devices

Arreghini, Antonio, Van den bosch, Geert, Kar, Gouri Sankar, Van Houdt, Jan

Year:

2012

Language:

english

File:

PDF, 300 KB

english, 2012

48

[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan, Italy (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Scalability Study of Fully Planarized Hybrid Floating Gate Flash Memory Cells with High-k IPD

Blomme, Pieter, Van Houdt, Jan

Year:

2012

Language:

english

File:

PDF, 229 KB

english, 2012

49

[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - An Ultra-Thin Hybrid Floating Gate Concept for Sub-20nm NAND Flash Technologies

Wellekens, Dirk, Blomme, Pieter, Rosmeulen, Maarten, Schram, Tom, Cacciato, Antonio, Debusschere, Ingrid, Van Aerde, Steven, Van Houdt, Jan

Year:

2011

Language:

english

File:

PDF, 391 KB

english, 2011

50

Performance of Direct Tunneling Floating Gate Memory with Medium-κ Dielectrics for Embedded-Random-Access Memory Applications

Govoreanu, Bogdan, Degraeve, Robin, Kauerauf, Thomas, Magnus, Wim, Wellekens, Dirk, Groeseneken, Guido, Van Houdt, Jan

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 281 KB

english, 2006